Title :
About Random Fault Detection of Combinational Networks
Author :
David, Réna ; Blanchet, Gérard
Author_Institution :
Laboratoire d´´Automatique de Grenoble
fDate :
6/1/1976 12:00:00 AM
Abstract :
Fault detection by applying a random input sequence simultaneously to a network under test and to a reference network is conside-red. A distinction between testing quality and detection quality is given. The detection surface is introduced as a characteristic parameter of a combinational network. The results are applied to TTL combinational circuits.
Keywords :
Combinational networks, detection quality, detection surface, random fault detection, testing quality.; Application software; Approximation methods; Circuit faults; Circuit testing; Delay; Digital circuits; Electrical fault detection; Fault detection; Probability; Upper bound; Combinational networks, detection quality, detection surface, random fault detection, testing quality.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1976.1674669
