DocumentCode :
113299
Title :
Hydrogen in ZnO: X-ray absorption measurements and multiple scattering theory
Author :
Petravic, M. ; Peter, R. ; Varasanec, M. ; Yang, Y.-W. ; Yano, M. ; Koike, K.
Author_Institution :
Dept. of Phys. & Center for Micro & Nano Sci. & Technol., Univ. of Rijeka, Rijeka, Croatia
fYear :
2014
fDate :
14-17 Dec. 2014
Firstpage :
60
Lastpage :
63
Abstract :
We have identified the microscopic structure of hydrogen donors in hydrogenated ZnO samples using near-edge x-ray absorption fine structure (NEXAFS) spectroscopy and ab initio multiple scattering calculations. We present the evidence of hydrogen occupying interstitial bond-centred locations where hydrogen atoms are attached to the host O atoms in bonds that are not parallel to the c axis. This work illustrates that the combined NEXAFS measurements and multiple scattering calculations can be used to identify the local local structural configuration of hydrogen impurities in ZnO that should have broad applications for other hydrogen-containing systems.
Keywords :
EXAFS; II-VI semiconductors; hydrogen; hydrogenation; impurities; wide band gap semiconductors; zinc compounds; NEXAFS spectroscopy; ZnO:H; ab initio multiple scattering calculation; hydrogen donor; hydrogen impurities; hydrogenated ZnO materials; interstitial bond-centred location; local local structural configuration; microscopic structure; near-edge X-ray absorption fine structure; Absorption; Atomic measurements; Hydrogen; Impurities; Scattering; Spectroscopy; Zinc oxide; NEXAFS; hydrogen donors; multiple scattering theory; zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronic and Microelectronic Materials & Devices (COMMAD), 2014 Conference on
Conference_Location :
Perth, WA
Print_ISBN :
978-1-4799-6867-1
Type :
conf
DOI :
10.1109/COMMAD.2014.7038652
Filename :
7038652
Link To Document :
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