• DocumentCode
    1133196
  • Title

    Turn-Off Characteristics of Power Transistors Using Emitter-Open Turn-Off

  • Author

    Chen, Dan Y. ; Jackson, Barry

  • Author_Institution
    Virginia Polytechnic Institute and State University
  • Issue
    3
  • fYear
    1981
  • fDate
    5/1/1981 12:00:00 AM
  • Firstpage
    386
  • Lastpage
    391
  • Abstract
    As compared with conventional reverse-biased turn-off, emitteropen turn-off provides superior transistor turn-off characteristics. Not only are the storage time and the fall time of the power transsistors much reduced, but also the device reverse-biased second breakdown phenomenon, commonly associated with turn-off of inductive load, is eliminated. Furthermore the storage time tolerance due to device variation and temperature change is minimized.
  • Keywords
    Electric breakdown; Energy efficiency; Low voltage; Power electronics; Power transistors; Reliability; Switching circuits; Teleprinting; Temperature; Turning;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9251
  • Type

    jour

  • DOI
    10.1109/TAES.1981.309066
  • Filename
    4102508