• DocumentCode
    1133201
  • Title

    A robust feedforward compensation scheme for multistage operational transconductance amplifiers with no Miller capacitors

  • Author

    Thandri, Bharath Kumar ; Silva-Martínez, José

  • Author_Institution
    Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
  • Volume
    38
  • Issue
    2
  • fYear
    2003
  • fDate
    2/1/2003 12:00:00 AM
  • Firstpage
    237
  • Lastpage
    243
  • Abstract
    A multistage operational transconductance amplifier with a feedforward compensation scheme which does not use Miller capacitors is introduced. The compensation scheme uses the positive phase shift of left-half-plane (LHP) zeroes caused by the feedforward path to cancel the negative phase shift of poles to achieve a good phase margin. A two-stage path increases further the low frequency gain while a feedforward single-stage amplifier makes the circuit faster. The amplifier bandwidth is not compromised by the absence of the traditional pole-splitting effect of Miller compensation, resulting in a high-gain wideband amplifier. The capacitors of a capacitive amplifier using the proposed techniques can be varied more than a decade without significant settling time degradation. Experimental results for a prototype fabricated in an AMI 0.5-μm CMOS process show DC gain of around 90 dB and a 1% settling time of 15 ns for a load capacitor of 12 pF. The power supply used is ±1.25 V.
  • Keywords
    CMOS analogue integrated circuits; compensation; feedforward; operational amplifiers; poles and zeros; wideband amplifiers; -1.25 V; 0.5 micron; 1.25 V; 15 ns; 90 dB; AMI CMOS process; capacitive amplifier; feedforward single-stage amplifier; high-gain wideband amplifier; left-half-plane zeroes; low frequency gain; multistage OTA; multistage operational transconductance amplifiers; phase compensation; pole negative phase shift cancellation; positive phase shift; robust feedforward compensation scheme; two-stage path; Bandwidth; Broadband amplifiers; Capacitors; Circuits; Degradation; Frequency; Operational amplifiers; Prototypes; Robustness; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2002.807410
  • Filename
    1175504