Title :
Analytical approach to sizing nFET chains
Author :
Bizzan, S.S. ; Jullien, G.A. ; Miller, W.C.
Author_Institution :
Windsor Univ., Ont., Canada
fDate :
7/2/1992 12:00:00 AM
Abstract :
An analytical approach to sizing nFET chains is presented. The technique is based on empirical observations of time constants in the classical RC delay model, and on a technology parameter determined from SPICE simulations. The technique allows a delay/area curve to be easily obtained, allowing tradeoff decisions by the circuit designer.
Keywords :
circuit analysis computing; delays; equivalent circuits; field effect transistor circuits; RC delay model; SPICE simulations; delay/area curve; nFET chains; technology parameter; time constants;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19920847
