DocumentCode :
1133827
Title :
Bandwidth measurements of ultrahigh-frequency optical detectors using the interferometric FM sideband technique
Author :
Eichen, Elliot ; Silletti, Andrew
Author_Institution :
GTE Labs. Inc., Waltham, MA, USA
Volume :
5
Issue :
10
fYear :
1987
fDate :
10/1/1987 12:00:00 AM
Firstpage :
1377
Lastpage :
1381
Abstract :
A frequency modulated semiconductor laser and an interferometer are used as a source of very high frequency amplitude modulation to measure the response of optical detectors. This new technique does not require a laser with a flat, or even known, frequency response, and measures the detector response at frequencies well above the modulation frequency applied to the laser. The response of several InGaAs p-i-n detectors has been measured to 22 GHz using 1.3- and 1.55-μm semiconductor lasers modulated at only 500 MHz. These measurements were not limited by the measurement method, which may be capable of measuring bandwidths substantially in excess of 20 GHz.
Keywords :
FM; Optical interferometry; Optical receivers; Piezoelectric resonators; Amplitude modulation; Bandwidth; Frequency measurement; Frequency modulation; Frequency response; Indium gallium arsenide; Optical detectors; Optical interferometry; PIN photodiodes; Semiconductor lasers;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.1987.1075442
Filename :
1075442
Link To Document :
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