Title :
Critical currents of Nb3Sn superconductors for generators under cyclic mechanical load
Author :
Kasahara, Hirofumi ; Torii, Shinji ; Akita, Shirabe ; Uyeda, Kiyotaka ; Ogawa, Tetsuji ; Ikeno, Yoshimitsu ; Inoue, Ltaru ; Saito, Takashi
Author_Institution :
Supercond. Dept., Central Res. Inst. of Electr. Power Ind., Tokyo, Japan
fDate :
7/1/1994 12:00:00 AM
Abstract :
Critical currents of Nb3Sn cabled superconductors were measured under cyclic mechanical compressive force of 30 MPa up to 10000 times. The conductors were developed for a superconducting generator under the Super-GM project. The conductors were designed to apply the field winding of the 70 MW-class superconducting generator. The 10000 repetitions of force application simulate 30 years of centrifugal and electromagnetic force produced by the daily start-and-stop (DSS) operation of the superconducting generator. In the test facility constructed at the Akagi Testing Center of the Central Research Institute of Electric Power Industry (CRIEPI), mechanical compressive force is generated by the cyclic fatigue test machine, which can generate 100 kN of force and is located on top of a cryostat at room temperature. Measured critical currents of two types of Nb3Sn conductor did not change throughout the test
Keywords :
AC generators; cable testing; critical currents; fatigue testing; niobium alloys; superconducting cables; superconducting machines; tin alloys; type II superconductors; 293 K; 30 MPa; 30 y; 70 MW; Akagi Testing Center; CRIEPI; Central Research Institute of Electric Power Industry; Nb3Sn; Nb3Sn superconductors; Super-GM project; cabled superconductors; centrifugal force; critical currents; cryostat; cyclic fatigue test machine; cyclic mechanical compressive force; cyclic mechanical load; daily start-and-stop operation; electromagnetic force; field winding; room temperature; superconducting generator; test facility; Conductors; Critical current; Current measurement; Force measurement; Mechanical cables; Niobium; Power generation; Superconducting cables; Testing; Tin;
Journal_Title :
Magnetics, IEEE Transactions on