Comparing the accuracy of critical-current measurements using the voltage-current simulator

Author

Aized, D. ; Haddad, J.W. ; Joshi, C.H. ; Goodrich, L.F. ; Srivastava, A.N.

Author_Institution

American Superconductor Corp., Westborough, MA, USA

Volume

30

Issue

4

fYear

1994

fDate

7/1/1994 12:00:00 AM

Firstpage

2014

Lastpage

2017

Abstract

A passive voltage-current simulator developed by the National Institute of Standards and Technology (NIST) is used to compare the accuracy of critical current measurements and the power-law behavior of high temperature superconductors (HTS). In this study, critical current measurements made from four data acquisition and analysis systems are compared with those carried out at NIST. This paper also discusses various measurement techniques, methods of calculating critical current, and n-values. The V-I simulator is believed to be an advancement towards defining the standards for critical current measurements and ensuring the traceability of results at different test facilities

Keywords

critical current density (superconductivity); electric current measurement; high-temperature superconductors; V-I simulator; critical-current measurements; high temperature superconductors; measurement techniques; n-values; power-law behavior; voltage-current simulator; Critical current; Current measurement; Data acquisition; Data analysis; High temperature superconductors; Measurement standards; Measurement techniques; NIST; Test facilities; Voltage;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.305662

Filename

305662