• DocumentCode
    1134524
  • Title

    A Note on Testing Logic Circuits by Transition Counting

  • Author

    Reddy, Sudhakar M.

  • Author_Institution
    Division of Information Engineering, University of Iowa
  • Issue
    3
  • fYear
    1977
  • fDate
    3/1/1977 12:00:00 AM
  • Firstpage
    313
  • Lastpage
    314
  • Abstract
    Test sets to detect single and multiple stuck-at faults in combinational networks by transition counting are given.
  • Keywords
    Single and multiple faults, transition count testing.; Automata; Boolean functions; Circuit faults; Circuit testing; Logic circuits; Logic testing; Minimization; Polarization; Switching circuits; Taylor series; Single and multiple faults, transition count testing.;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1977.1674831
  • Filename
    1674831
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1134524