• DocumentCode
    1134712
  • Title

    A Max-Min Measure for Image Texture Analysis

  • Author

    Mitchell, Owen R. ; Myers, Charles R. ; Boyne, William

  • Author_Institution
    School of Electrical Engineering, Purdue University
  • Issue
    4
  • fYear
    1977
  • fDate
    4/1/1977 12:00:00 AM
  • Firstpage
    408
  • Lastpage
    414
  • Abstract
    A new technique for image texture analysis is described which uses the relative frequency of local extremes in grey level as the principal measure. This method is invariant to multiplicative gain changes (such as caused by changes in illumination level or film processing) and is invariant to image resolution and sampling rate if the image is not undersampled. The algorithm described is computationally simple and can be implemented in hardware for real-time analysis. Comparisons are made between this new method and the spatial dependence method of texture analysis using 49 samples of each of eight textures. The new method seems just as accurate and considerably faster.
  • Keywords
    Digital image processing, feature extraction, pattern recognition, smoothing algorithms, texture analysis.; Algorithm design and analysis; Covariance matrix; Error analysis; Frequency; Image resolution; Image texture analysis; Lighting; Nearest neighbor searches; Pattern analysis; Pattern recognition; Digital image processing, feature extraction, pattern recognition, smoothing algorithms, texture analysis.;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1977.1674850
  • Filename
    1674850