Title :
An Algorithm for Testing Random Access Memories
Author :
Knaizuk, John, Jr. ; Hartmann, C.R.P.
Author_Institution :
Department of Computer Science, State University College
fDate :
4/1/1977 12:00:00 AM
Abstract :
This correspondence presents an optimal algorithm to detect any single stuck-at-1 (s-a-1), stuck-at-0 (s-a-0) fault in a random access memory using only the n-bit memory address register input and m-bit memory buffer register input and output lines. It is shown that this algorithm requires 4 X 2nmemory accesses.
Keywords :
Fault detection, optimal algorithm, random access memory, single stuck-at-fault.; Automatic testing; Circuit faults; Circuit testing; Decoding; Fault detection; Hamming distance; Random access memory; Read-write memory; Registers; Sequential analysis; Fault detection, optimal algorithm, random access memory, single stuck-at-fault.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1977.1674851
