Title :
A Literature Review of IGBT Fault Diagnostic and Protection Methods for Power Inverters
Author :
Lu, Bin ; Sharma, Santosh K.
Author_Institution :
Innovation Center, Eaton Corp., Milwaukee, WI, USA
Abstract :
This paper presents a survey on existing methods for fault diagnosis and protection of insulated gate bipolar transistors with special focus on those used in three-phase power inverters. Twenty-one methods for open-circuit faults and ten methods for short-circuit faults are evaluated and summarized, based on their performance and implementation efforts. The gate-misfiring faults and their diagnostic methods are also briefly discussed. Finally, the promising methods are recommended for future work.
Keywords :
fault diagnosis; insulated gate bipolar transistors; invertors; IGBT fault diagnostic method; gate-misfiring faults; insulated gate bipolar transistors; open-circuit faults; protection methods; short-circuit faults; three-phase power inverters; Fault diagnosis; gate-misfiring fault; insulated gate bipolar transistor (IGBT); open-circuit fault; power inverter; short-circuit fault;
Journal_Title :
Industry Applications, IEEE Transactions on
DOI :
10.1109/TIA.2009.2027535