• DocumentCode
    1135104
  • Title

    A Literature Review of IGBT Fault Diagnostic and Protection Methods for Power Inverters

  • Author

    Lu, Bin ; Sharma, Santosh K.

  • Author_Institution
    Innovation Center, Eaton Corp., Milwaukee, WI, USA
  • Volume
    45
  • Issue
    5
  • fYear
    2009
  • Firstpage
    1770
  • Lastpage
    1777
  • Abstract
    This paper presents a survey on existing methods for fault diagnosis and protection of insulated gate bipolar transistors with special focus on those used in three-phase power inverters. Twenty-one methods for open-circuit faults and ten methods for short-circuit faults are evaluated and summarized, based on their performance and implementation efforts. The gate-misfiring faults and their diagnostic methods are also briefly discussed. Finally, the promising methods are recommended for future work.
  • Keywords
    fault diagnosis; insulated gate bipolar transistors; invertors; IGBT fault diagnostic method; gate-misfiring faults; insulated gate bipolar transistors; open-circuit faults; protection methods; short-circuit faults; three-phase power inverters; Fault diagnosis; gate-misfiring fault; insulated gate bipolar transistor (IGBT); open-circuit fault; power inverter; short-circuit fault;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2009.2027535
  • Filename
    5165060