DocumentCode
1135392
Title
Synthesis of Optimal Ambiguity Resolver Functions
Author
Mehta, Madhu A. ; Smith, William Bridges
Author_Institution
Digital Systems International
Issue
8
fYear
1977
Firstpage
782
Lastpage
789
Abstract
Large-scale integration (LSI) circuits impose particular constraints and present special opportunities for improving the diagnostic resolution of a digital system. In particular, bond failures represent a very significant failure mode in integrated circuits, so it is important to be able to identify a fault on an input/output lead to a single bus of a least replaceable unit, and it is desirable to do this using a minimum number of test points.
Keywords
Fault detection, logic circuits with special properties, optimal testing, special test functions.; Bonding; Bridge circuits; Circuit faults; Circuit synthesis; Circuit testing; Digital systems; Fault diagnosis; Integrated circuit synthesis; Large scale integration; Logic testing; Fault detection, logic circuits with special properties, optimal testing, special test functions.;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1977.1674916
Filename
1674916
Link To Document