• DocumentCode
    1135403
  • Title

    Parameter de-embedding accuracy dependency upon material sample dimensions

  • Author

    Park, A. ; Dominek, Allen

  • Author_Institution
    Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
  • Volume
    40
  • Issue
    8
  • fYear
    1992
  • fDate
    8/1/1992 12:00:00 AM
  • Firstpage
    1674
  • Lastpage
    1680
  • Abstract
    The sensitivity of the sample fit in rectangular waveguide fixtures is examined for constitutive parameter de-embedding. The sensitivity is characterized through a percent error figure between the de-embedded and known parameter values when an air gap exists between the sample and the side walls of the fixture. The de-embedding process assumed a completely filled waveguide in which rigorously calculated S parameters for material sample air gaps in either the E- or H-plane walls of the waveguide were used. The presence of an air gap was very noticeable for a E-plane gap. Commonly used gap correction factors provided limited improvement in reducing air gap related errors
  • Keywords
    S-parameters; dielectric-loaded waveguides; rectangular waveguides; E-plane gap; H-plane walls; S parameters; air gap; completely filled waveguide; de-embedding accuracy dependency; gap correction factors; material sample dimensions; parameter values; rectangular waveguide fixtures; side walls; Air gaps; Error correction; Fixtures; Moment methods; Planar waveguides; Rectangular waveguides; Reflection; Temperature; Transmission lines; Waveguide discontinuities;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.149547
  • Filename
    149547