DocumentCode
1135403
Title
Parameter de-embedding accuracy dependency upon material sample dimensions
Author
Park, A. ; Dominek, Allen
Author_Institution
Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
Volume
40
Issue
8
fYear
1992
fDate
8/1/1992 12:00:00 AM
Firstpage
1674
Lastpage
1680
Abstract
The sensitivity of the sample fit in rectangular waveguide fixtures is examined for constitutive parameter de-embedding. The sensitivity is characterized through a percent error figure between the de-embedded and known parameter values when an air gap exists between the sample and the side walls of the fixture. The de-embedding process assumed a completely filled waveguide in which rigorously calculated S parameters for material sample air gaps in either the E - or H -plane walls of the waveguide were used. The presence of an air gap was very noticeable for a E -plane gap. Commonly used gap correction factors provided limited improvement in reducing air gap related errors
Keywords
S-parameters; dielectric-loaded waveguides; rectangular waveguides; E-plane gap; H-plane walls; S parameters; air gap; completely filled waveguide; de-embedding accuracy dependency; gap correction factors; material sample dimensions; parameter values; rectangular waveguide fixtures; side walls; Air gaps; Error correction; Fixtures; Moment methods; Planar waveguides; Rectangular waveguides; Reflection; Temperature; Transmission lines; Waveguide discontinuities;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.149547
Filename
149547
Link To Document