DocumentCode
1135472
Title
Investigation of binary Josephson arrays for arbitrary waveform synthesis
Author
Kleinschmidt, P. ; Patel, P.D. ; Williams, J.M. ; Janssen, T.J.B.M.
Author_Institution
Nat. Phys. Lab., Teddington, UK
Volume
149
Issue
6
fYear
2002
Firstpage
313
Lastpage
319
Abstract
Arrays of Josephson junctions have been used successfully for many years as the primary standard of voltage. A recent development has been the fabrication of arrays, based on nonhysteretic Josephson junctions, which allows the voltage output to be changed almost instantaneously. When these arrays are divided into binary segments a ´digital-to-analogue converter´ with quantum accuracy is created. The properties of two types of array, a SINIS (superconductor-insulator-normal conductor-insulator-superconductor) array, using intrinsic shunting of the Josephson junctions, and a SIS (superconductor-insulator-superconductor) array with external, on-chip shunting have been investigated. The accuracy of the generated voltages and AC properties of the arrays when driven with a purpose-built, programmable current bias source are discussed. It is anticipated that a Josephson standard having waveforms with calculable RMS values of AC voltage will soon be available.
Keywords
digital-analogue conversion; electric current; measurement standards; superconductor-insulator-superconductor devices; superconductor-normal-superconductor devices; voltage measurement; waveform generators; Josephson junction intrinsic shunting; SINIS array; SIS array; arbitrary waveform synthesis; array AC properties; binary Josephson arrays; binary segment array division; calculable waveform RMS AC voltage values; digital-to-analogue converter; external on-chip shunting; generated voltage accuracy; instantaneous output voltage change; nonhysteretic Josephson junctions; primary voltage standards; programmable current bias source; quantum accuracy DAC; superconductor-insulator-normal conductor-insulator-superconductor array; superconductor-insulator-superconductor array;
fLanguage
English
Journal_Title
Science, Measurement and Technology, IEE Proceedings -
Publisher
iet
ISSN
1350-2344
Type
jour
DOI
10.1049/ip-smt:20020759
Filename
1176536
Link To Document