Title :
Study of Carrier Statistics in Uniaxially Strained Ge for a Low-Threshold Ge Laser
Author :
Donguk Nam ; Sukhdeo, David S. ; Gupta, Swastik ; Ju-Hyung Kang ; Brongersma, Mark L. ; Saraswat, Krishna C.
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
Abstract :
In this paper, we present a comprehensive study of carrier statistics in germanium with high uniaxial strain along the [100] direction. Several types of PL experiments were conducted to investigate polarization-, temperature- and excitation-dependent carrier statistics in germanium under various amounts of uniaxial strain. With the ability to clearly resolve multiple photoluminescence peaks originating from strain-induced valence band splitting, we experimentally observed strongly polarized light emission from direct band gap transitions. Our experiments also confirm that uniaxial strain increases the hole population in the highest valence band as well as the electron population in the direct conduction band. Based upon our experimental results, we present theoretical modeling showing that the lasing threshold of a germanium laser can be reduced by >100× with 2.5% strain.
Keywords :
conduction bands; elemental semiconductors; energy gap; germanium; hole mobility; light polarisation; optical interconnections; photoluminescence; piezo-optical effects; semiconductor lasers; thermo-optical effects; valence bands; Ge; PL experiments; direct band gap transitions; direct conduction band; electron population; excitation-dependent carrier statistics; germanium laser; high uniaxial strain; hole population; lasing threshold; low-threshold Ge laser; multiple photoluminescence peaks; polarization-dependent carrier statistics; strain-induced valence band splitting; strongly polarized light emission; temperature-dependent carrier statistics; theoretical modeling; uniaxially strained Ge; Laser excitation; Optical polarization; Photonic band gap; Silicon; Temperature measurement; Uniaxial strain; Germanium; Raman spectroscopy; lasers; optical interconnects; photoluminescence; strain;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2013.2293764