DocumentCode
1135794
Title
Dielectric response in dimethyl substituted pyridines using microwave cavity spectrometer
Author
Johri, G.K. ; Johri, M. ; Sharma, Ritu ; Johri, S.
Author_Institution
Dept. of Phys. & Electron., D.A.-V. Coll., Kanpur, India
Volume
10
Issue
1
fYear
2003
Firstpage
96
Lastpage
101
Abstract
A study of the dielectric response of dimethyl substituted pyridines (lutidines) has been reported in the temperature range 293-323 K. The microwave cavity spectrometer has been used to measure the relative shift, width and amplitude of the resonance profile for the sample loaded in the cavity operated in TM010 mode at a fixed frequency of 9.0 GHz. The Slater´s perturbation equations are used to analyze the measured data and permittivity and dielectric loss have been obtained using interaction form factor. Significant effect in the dielectric response and interaction has been found due to change of the position of the -CH3 functional groups.
Keywords
cavity resonators; dielectric loss measurement; dielectric relaxation; electromagnetic wave absorption; insulation testing; intermolecular forces; microwave spectrometers; permittivity measurement; thermal analysis; thermodynamics; 293 to 323 K; 9.0 GHz; CH3 functional groups; Slater´s perturbation equations; TM010 mode; bulk properties; dielectric insulation; dielectric loss; dielectric relaxation; dielectric response; dimethyl substituted pyridines; interaction form factor; intermolecular forces; lutidines; macroscopic structure; measured data; microwave absorption; microwave cavity spectrometer; molecular interaction; organic liquids; permittivity; relative shift measurement; relaxation mechanism; resonance profile; thermodynamical properties; Data analysis; Dielectric loss measurement; Dielectric measurements; Electrochemical impedance spectroscopy; Equations; Frequency measurement; Microwave measurements; Permittivity measurement; Resonance; Temperature distribution;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/TDEI.2003.1176566
Filename
1176566
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