Electroabsorption spectroscopy analysis of quantum-well modulator extinction and chirp

Author

Kim, In ; Jang, Dong-Hoon

Author_Institution

Telecommun. R&D Center, Samsung Electron. Co., Gyeonggi-Do, South Korea

Volume

16

Issue

11

fYear

2004

Firstpage

2463

Lastpage

2465

Abstract

Electroabsorption (EA) spectroscopy measurement on a planar wafer is used to estimate the extinction and chirp characteristics of the compressively strained quantum-well (QW) EA modulator. Whereas the Stark shift dominates the behavior of 90-Å well/75-Å barrier QW, 75-Å well/50-Å barrier structure features absorption edge broadening, and the chirp parameter decreases nonlinearly with bias. The EA spectroscopy results are compared with the characteristics of the modulator in the EA modulated laser.

Keywords

Stark effect; chirp modulation; electro-optical modulation; electroabsorption; extinction coefficients; infrared spectra; semiconductor quantum wells; spectral line broadening; 50 angstrom; 75 angstrom; 90 angstrom; EA modulated laser; Stark shift; absorption edge broadening; barrier structure; compressively strained quantum-well; electroabsorption spectroscopy; modulator chirp; modulator extinction; planar wafer; quantum-well modulator; Absorption; Chirp modulation; Distributed feedback devices; Laser feedback; Optical modulation; Optical transmitters; Quantum well devices; Quantum well lasers; Quantum wells; Spectroscopy;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2004.835640

Filename

1344068