DocumentCode
1135921
Title
Computer-Aided Logic Design of Two-Level MOS Combinational Networks with Statistical Results
Author
El-ziq, Yacoub M. ; Su, Stephen Y H
Author_Institution
Design Automation and Test Department, Sperry Univac
Issue
10
fYear
1978
Firstpage
911
Lastpage
923
Abstract
Metal-oxide-semiconductor (MOS) logic elements offer advantages over bipolar logic elements, such as smaller size, complexity, and power consumption, as well as more flexibility and versatility. Since MOS is playing a major role in large-scale integration (LSI), synthesis of MOS networks with a large number of variables is very important.
Keywords
Boolean functions; combinational logic; combinational networks; computer algorithm; diagnosable networks; easily testable networks; field-effect transistors; logic design automation; logic synthesis; metal-oxide semiconductor; statistical data; testability; Automatic testing; Computer networks; Costs; Design automation; Energy consumption; FETs; Large scale integration; Logic design; Logic testing; Network synthesis; Boolean functions; combinational logic; combinational networks; computer algorithm; diagnosable networks; easily testable networks; field-effect transistors; logic design automation; logic synthesis; metal-oxide semiconductor; statistical data; testability;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1978.1674970
Filename
1674970
Link To Document