• DocumentCode
    1136168
  • Title

    When to Use Random Testing

  • Author

    Agrawal, Vishwani D.

  • Author_Institution
    Bell Laboratories
  • Issue
    11
  • fYear
    1978
  • Firstpage
    1054
  • Lastpage
    1055
  • Abstract
    A probabilistic method for deciding whether a combinational circuit should be tested by random inputs, is given. This decision is based upon certain easily observable circuit parameters, such as, the number of primary inputs, the number of levels, and the average fan in.
  • Keywords
    Diagnosis; fault detection; random testing; test generation; Diagnosis; fault detection; random testing; test generation;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1978.1674994
  • Filename
    1674994
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1136168