DocumentCode :
1136168
Title :
When to Use Random Testing
Author :
Agrawal, Vishwani D.
Author_Institution :
Bell Laboratories
Issue :
11
fYear :
1978
Firstpage :
1054
Lastpage :
1055
Abstract :
A probabilistic method for deciding whether a combinational circuit should be tested by random inputs, is given. This decision is based upon certain easily observable circuit parameters, such as, the number of primary inputs, the number of levels, and the average fan in.
Keywords :
Diagnosis; fault detection; random testing; test generation; Diagnosis; fault detection; random testing; test generation;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1978.1674994
Filename :
1674994
Link To Document :
بازگشت