Title :
Universal Test Sets for Multiple Fault Detection in AND-EXOR Arrays
Author :
Pradhan, Dhiraj K.
Author_Institution :
Department of Computer Science, University of Regina
Abstract :
The fault-detection problem in AND-EXOR arrays is formulated in a new framework. The arrays considered are more general compared to those by the previous researchers. Designs of fault-detecting test sets to detect all multiple faults in these networks are presented. The designs are independent of the function realized and hence can be generated easily.
Keywords :
AND-EXOR arrays; cellular arrays; complete test set; controllable input; fault detection; mixed polarity expansion; multiple fault detection; observable output; Circuit faults; Circuit testing; Data analysis; Electrical fault detection; Fault detection; Integrated circuit technology; Logic functions; Pattern recognition; Probability density function; Tellurium; AND-EXOR arrays; cellular arrays; complete test set; controllable input; fault detection; mixed polarity expansion; multiple fault detection; observable output;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1978.1675057
