• DocumentCode
    1136798
  • Title

    Universal Test Sets for Multiple Fault Detection in AND-EXOR Arrays

  • Author

    Pradhan, Dhiraj K.

  • Author_Institution
    Department of Computer Science, University of Regina
  • Issue
    2
  • fYear
    1978
  • Firstpage
    181
  • Lastpage
    187
  • Abstract
    The fault-detection problem in AND-EXOR arrays is formulated in a new framework. The arrays considered are more general compared to those by the previous researchers. Designs of fault-detecting test sets to detect all multiple faults in these networks are presented. The designs are independent of the function realized and hence can be generated easily.
  • Keywords
    AND-EXOR arrays; cellular arrays; complete test set; controllable input; fault detection; mixed polarity expansion; multiple fault detection; observable output; Circuit faults; Circuit testing; Data analysis; Electrical fault detection; Fault detection; Integrated circuit technology; Logic functions; Pattern recognition; Probability density function; Tellurium; AND-EXOR arrays; cellular arrays; complete test set; controllable input; fault detection; mixed polarity expansion; multiple fault detection; observable output;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1978.1675057
  • Filename
    1675057
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1136798