DocumentCode
1136808
Title
Boolean Network Probabilities and Network Design
Author
McCluskey, E.J. ; Parker ; Shedletsky, John J.
Author_Institution
Digital Systems Laboratory, Department of Computer Science and Electrical Engineering, Stanford University
Issue
2
fYear
1978
Firstpage
187
Lastpage
189
Abstract
The correspondence between Boolean network probabilities and the design formalisms of Ledley and Aiken is demonstrated.
Keywords
Combinational circuits; fault detection; probabilistic testing; Circuit faults; Circuit testing; Electrical fault detection; Electrons; Fault detection; Fault diagnosis; Logic functions; Logic testing; Minimization; Notice of Violation; Combinational circuits; fault detection; probabilistic testing;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1978.1675058
Filename
1675058
Link To Document