DocumentCode :
1136888
Title :
Comments on "Procedures for Eliminating Static and Dynamic Hazards in Test Generation"
Author :
Hlawiczka, Andrzej
Author_Institution :
Instytut Maszyn Matematycznych
Issue :
2
fYear :
1978
Firstpage :
191
Lastpage :
191
Abstract :
The following comments on the paper1by M. A. Breuer may be in order.
Keywords :
Circuit testing; Delay; Hafnium; Hazards; Information processing; Logic; Reflective binary codes; Sequential analysis; Sequential circuits; Switching circuits;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1978.1675064
Filename :
1675064
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1136888
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