DocumentCode
1137588
Title
Optimal Detection of Bridge Faults and Stuck-At Faults in Two-Level Logic
Author
Iosupovicz, Alexander
Author_Institution
Department of Electrical and Computer Engineering, California State University
Issue
5
fYear
1978
fDate
5/1/1978 12:00:00 AM
Firstpage
452
Lastpage
455
Abstract
Bridge faults are caused by permanent circuit failures which result in two signal wires in a logic network becoming accidentally shorted. Such faults cannot be modeled as stuck-at faults. Some of them have the effect of transforming a combinational logic circuit into a sequential circuit.
Keywords
Bridge faults; fault detection experiments; minimal test set; stuck-at faults; two-level logic; unate functions; Bridge circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault diagnosis; Intelligent networks; Logic circuits; Logic testing; Wires; Bridge faults; fault detection experiments; minimal test set; stuck-at faults; two-level logic; unate functions;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1978.1675125
Filename
1675125
Link To Document