Title :
Optimal Detection of Bridge Faults and Stuck-At Faults in Two-Level Logic
Author :
Iosupovicz, Alexander
Author_Institution :
Department of Electrical and Computer Engineering, California State University
fDate :
5/1/1978 12:00:00 AM
Abstract :
Bridge faults are caused by permanent circuit failures which result in two signal wires in a logic network becoming accidentally shorted. Such faults cannot be modeled as stuck-at faults. Some of them have the effect of transforming a combinational logic circuit into a sequential circuit.
Keywords :
Bridge faults; fault detection experiments; minimal test set; stuck-at faults; two-level logic; unate functions; Bridge circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault diagnosis; Intelligent networks; Logic circuits; Logic testing; Wires; Bridge faults; fault detection experiments; minimal test set; stuck-at faults; two-level logic; unate functions;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1978.1675125
