• DocumentCode
    1137711
  • Title

    Efficient Design of Self-Checking Checker for any m-Out-of-n Code

  • Author

    Marouf, Mohamed Abdelaziz ; Friedman, Arthur D.

  • Author_Institution
    Bell Laboratories
  • Issue
    6
  • fYear
    1978
  • fDate
    6/1/1978 12:00:00 AM
  • Firstpage
    482
  • Lastpage
    490
  • Abstract
    The use of self-checking checkers in the design of highly reliable systems has many significant advantages. It allows errors to be detected upon occurrence without testing, whether the error is caused by a permanent or intermittent fault. However, there are relatively few codes for which efficient self-checking checkers have been designed. In this paper we present procedures for designing efficient self-checking checkers for m-out-of-n codes (i.e., codes where each valid code word consists of m bits with value 1 and n – m bits with value 0). Codes for arbitrary values of m and n are considered. Realizations which require significantly less logic than previously known realizations are presented for all cases except n = 2m and m = 1. These checkers are totally self-checking for all single and unidirectional multiple stuck-type faults. They are also very easy to test compared with previously presented realizations. Saving in logic complexity and testing complexity of 70 to 97 percent is demonstrated.
  • Keywords
    Coding; fault detection; logic design; m-out-of-n checkers; self-checking; unate functions; unidirectional errors; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Design methodology; Electrical fault detection; Fault detection; Fault tolerance; Logic testing; System testing; Coding; fault detection; logic design; m-out-of-n checkers; self-checking; unate functions; unidirectional errors;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1978.1675138
  • Filename
    1675138