Improved calibration and measurement of the scattering parameters of microwave integrated circuits

Author

Pantoja, Renato R. ; Howes, Michael J. ; Richardson, John R. ; Pollard, Roger D.

Author_Institution

Dept. of Electr. & Electron. Eng., Leeds Univ., UK

Volume

37

Issue

11

fYear

1989

fDate

11/1/1989 12:00:00 AM

Firstpage

1675

Lastpage

1680

Abstract

A novel procedure for the calibration of microwave integrated circuit test fixtures, based on a generalization of the through-reflect-line (TRL) algorithm, is presented. Its advantages compared with previous methods, namely bandwidth of validity and standards availability, are discussed. The approach is verified through the characterization of a particular microstrip verification standard using both the generalized TRL and precision 7-mm calibration techniques. Comparison of the results obtained from these schemes indicates that both the effective directivity and the source/load match are better than 30 dB

Keywords

S-parameters; calibration; integrated circuit testing; measurement errors; measurement standards; microwave integrated circuits; microwave measurement; MIC test fixtures; TRL algorithm generalisation; calibration; effective directivity; microstrip verification standard; microwave integrated circuits; scattering parameters; source/load match; standards availability; through-reflect-line; transmission line length; Bandwidth; Calibration; Circuit testing; Integrated circuit measurements; Integrated circuit modeling; Microwave integrated circuits; Microwave measurements; Scattering parameters; Transmission line matrix methods; Transmission line measurements;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.41030

Filename

41030