Title :
A 32-channel, 0.25 μm CMOS ASIC for the readout of the silicon drift detectors of the ALICE experiment
Author :
Mazza, G. ; Rivetti, A. ; Anelli, G. ; Anghinolfi, F. ; Martinez, M.I. ; Rotondo, F.
Author_Institution :
Inst. Nazionale di Fisica Nucl.e sez. di Torino, Italy
Abstract :
In this paper we present a 32 channel ASIC prototype for the readout of the silicon drift detectors (SDDs) of the ALICE experiment. The ASIC integrates on the same substrate 32 transimpedance amplifiers, a 32 × 256 cell analogue memory and 16 successive approximation 10 bit A/D converters. The circuit amplifies and samples at 40 MS/s the input signal in a continuous way. When an external trigger signal validates the acquisition, the sampling is stopped and the data are digitized at lower speed (0.5 MS/s). The chip has been designed and fabricated in a commercial 0.25 μm CMOS technology. It has been extensively tested both on a bench and connected with a detector in several beam tests. In this paper both design issues and test results are presented. The radiation tolerance of the design has been increased by special layout techniques. Total dose irradiation tests are also presented.
Keywords :
CMOS integrated circuits; analogue-digital conversion; dosimetry; nuclear electronics; position sensitive particle detectors; readout electronics; silicon radiation detectors; 0.25 micron; 10 bit A/D converters; 32 channel ASIC prototype; ALICE experiment; CMOS technology; cell analogue memory; chip fabrication; external trigger signal; front-end electronics; input signal; mixed-mode circuits; radiation tolerance; silicon drift detectors; special layout techniques; successive approximation; total dose irradiation tests; transimpedance amplifiers; Anodes; Application specific integrated circuits; CMOS technology; Circuit testing; Detectors; Frequency; Sampling methods; Sensor arrays; Silicon; Time measurement; A/D conversion; drift detectors; front-end electronics; mixed-mode circuits; radiation tolerance;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.834716