Title :
Deductive Fault Simulation with Functional Blocks
Author :
Menon, Premachandran R. ; Chappell, Stephen G.
Author_Institution :
Bell Laboratories
Abstract :
This paper presents a method of propagating the effects of faults through functional blocks using the deductive (fault list) technique. An extension of the method is shown to be effective for simulating internal faults in functional blocks. The techniques presented here have been used for implementing the functional simulation capability in the Logic Analysis for Maintenance Planning (LAMP) System at Bell Laboratories.
Keywords :
Deductive; fault lists; fault propagation; faults; functional; functional faults; simulation; Analytical models; Circuit faults; Circuit simulation; Computational modeling; Computer simulation; Digital simulation; Digital systems; Fault diagnosis; Lamps; Logic; Deductive; fault lists; fault propagation; faults; functional; functional faults; simulation;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1978.1675175
