Author_Institution :
IBM T. J. Watson Research Center
Keywords :
CMOS logic circuits; Conferences; Electron Devices Society; FETs; Nanoelectronics; Nanoscale devices; Physics; Semiconductor device modeling; Semiconductor process modeling; Silicon;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2002.807395
