Title :
Carbon nanotube electronics
Author :
Appenzeller, Joerg ; Knoch, Joachim ; Martel, Richard ; Derycke, Vincent ; Wind, Shalom J. ; Avouris, Phaedon
Author_Institution :
T. J. Watson Res. Center, IBM, Yorktown Heights, NY, USA
fDate :
12/1/2002 12:00:00 AM
Abstract :
Presents experimental results on single-wall carbon nanotube field-effect transistors (CNFETs) operating at gate and drain voltages below 1V. Taking into account the extremely small diameter of the semiconducting tubes used as active components, electrical characteristics are comparable with state-of-the-art metal oxide semiconductor field-effect transistors (MOSFETs). While output as well as subthreshold characteristics resemble those of conventional MOSFETs, we find that CNFET operation is actually controlled by Schottky barriers (SBs) in the source and drain region instead of by the nanotube itself. Due to the small size of the contact region between the electrode and the nanotube, these barriers can be extremely thin, enabling good performance of SB-CNFETs.
Keywords :
Schottky barriers; carbon nanotubes; field effect transistors; nanotube devices; SB-CNFETs; Schottky barriers; Si; contact region; drain voltages; electrical characteristics; gate voltages; semiconducting tubes; single-wall carbon nanotube field-effect transistors; subthreshold characteristics; Brillouin scattering; Carbon nanotubes; Chemical elements; Electron tubes; FETs; MOSFETs; Nanoelectronics; Schottky barriers; Semiconductivity; Thermal conductivity;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2002.807390