• DocumentCode
    1138256
  • Title

    A practical SPICE model based on the physics and characteristics of realistic single-electron transistors

  • Author

    Lee, Sang-Hoon ; Kim, Dae Hwan ; Kim, Kyung Rok ; Lee, Jong Duk ; Park, Byung-Gook ; Gu, Young-Jin ; Yang, Gi-Young ; Kong, Jeong-Taek

  • Author_Institution
    Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
  • Volume
    1
  • Issue
    4
  • fYear
    2002
  • fDate
    12/1/2002 12:00:00 AM
  • Firstpage
    226
  • Lastpage
    232
  • Abstract
    A practical model for a single-electron transistor (SET) was developed based on the physical phenomena in realistic Si SETs, and implemented into a conventional circuit simulator. In the proposed model, the SET current calculated by the analytic model is combined with the parasitic MOSFET characteristics, which have been observed in many recently reported SETs formed on Si nanostructures. The SPICE simulation results were compared with the measured characteristics of the Si SETs. In terms of the bias, temperature, and size dependence of the realistic SET characteristics, an extensive comparison leads to good agreement within a reasonable level of accuracy. This result is noticeable in that a single set of model parameters was used, while considering divergent physical phenomena such as the parasitic MOSFET, the Coulomb oscillation phase shift, and the tunneling resistance modulated by the gate bias. When compared to the measured data, the accuracy of the voltage transfer characteristics of a single-electron inverter obtained from the SPICE simulation was within 15%. This new SPICE model can be applied to estimating the realistic performance of a CMOS/SET hybrid circuit or various SET logic architectures.
  • Keywords
    MOSFET; SPICE; capacitance; circuit simulation; elemental semiconductors; logic gates; silicon; silicon-on-insulator; single electron transistors; tunnelling; Coulomb oscillation phase shift; SET current; SPICE model; Si; bias; circuit simulator; logic architectures; model parameters; parasitic MOSFET characteristics; single-electron transistors; tunneling resistance; voltage transfer characteristics; CMOS logic circuits; Circuit simulation; MOSFET circuits; Nanostructures; Phase modulation; Physics; SPICE; Single electron transistors; Temperature dependence; Tunneling;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2002.807394
  • Filename
    1176969