DocumentCode
1138256
Title
A practical SPICE model based on the physics and characteristics of realistic single-electron transistors
Author
Lee, Sang-Hoon ; Kim, Dae Hwan ; Kim, Kyung Rok ; Lee, Jong Duk ; Park, Byung-Gook ; Gu, Young-Jin ; Yang, Gi-Young ; Kong, Jeong-Taek
Author_Institution
Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
Volume
1
Issue
4
fYear
2002
fDate
12/1/2002 12:00:00 AM
Firstpage
226
Lastpage
232
Abstract
A practical model for a single-electron transistor (SET) was developed based on the physical phenomena in realistic Si SETs, and implemented into a conventional circuit simulator. In the proposed model, the SET current calculated by the analytic model is combined with the parasitic MOSFET characteristics, which have been observed in many recently reported SETs formed on Si nanostructures. The SPICE simulation results were compared with the measured characteristics of the Si SETs. In terms of the bias, temperature, and size dependence of the realistic SET characteristics, an extensive comparison leads to good agreement within a reasonable level of accuracy. This result is noticeable in that a single set of model parameters was used, while considering divergent physical phenomena such as the parasitic MOSFET, the Coulomb oscillation phase shift, and the tunneling resistance modulated by the gate bias. When compared to the measured data, the accuracy of the voltage transfer characteristics of a single-electron inverter obtained from the SPICE simulation was within 15%. This new SPICE model can be applied to estimating the realistic performance of a CMOS/SET hybrid circuit or various SET logic architectures.
Keywords
MOSFET; SPICE; capacitance; circuit simulation; elemental semiconductors; logic gates; silicon; silicon-on-insulator; single electron transistors; tunnelling; Coulomb oscillation phase shift; SET current; SPICE model; Si; bias; circuit simulator; logic architectures; model parameters; parasitic MOSFET characteristics; single-electron transistors; tunneling resistance; voltage transfer characteristics; CMOS logic circuits; Circuit simulation; MOSFET circuits; Nanostructures; Phase modulation; Physics; SPICE; Single electron transistors; Temperature dependence; Tunneling;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2002.807394
Filename
1176969
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