Title :
Recursive Methods for Matrix Inversion in Pattern Recognition Environments
Author :
Naccarato, David ; Chien, Y.T.
Author_Institution :
University of New Haven
Abstract :
Simple recursive methods for inverting an n x n matrix A + E in terms of A-1and E are presented, where E represents a matrix of modifications of the matrix A. Algorithms for rank one and rank r matrix modifications are given. In addition, simple methods for determining if A + E is invertible are developed. Applications of these methods to pattern recognition problems where the inversion of a matrix (eg., covariance matrix, scatter matrix, etc.) must. be computed and frequently updated as changes in data occur are illustrated.
Keywords :
Matrix inversion; multivariate analysis; pattern recognition; recursive methods; test for invertibility; Covariance matrix; Gaussian distribution; III-V semiconductor materials; Pattern analysis; Pattern recognition; Scattering; Testing; Matrix inversion; multivariate analysis; pattern recognition; recursive methods; test for invertibility;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1978.1675206