• DocumentCode
    1138555
  • Title

    A Functional Form Approach to Test Set Coverage in Tree Networks

  • Author

    Agarwal, V.K. ; Masson, G.M.

  • Author_Institution
    Department of Electrical and Computer Engineering, Wayne State University
  • Issue
    1
  • fYear
    1979
  • Firstpage
    50
  • Lastpage
    52
  • Abstract
    To efficiently perform the fault analysis of digital networks it is necessary that pertinent fault interrelationships be utilized. However, to determine these fault interrelationships can entail an analysis which is quite complex and thereby reduces the overall advantage of utilizing the gained insights in a fault analysis process. In this paper we suggest an approach to establishing the existence of a certain fault interrelationship relative to test set coverage in tree networks which is based only on the form of the output function. A procedure is given for generating a form expression (called an L-expression) corresponding to that function. A theorem is stated regarding the interpretation of these form expressions relative to test set coverage.
  • Keywords
    Complete test sets; L-expression; coverage; fault complexes; functional form; generic form; multiple fault events; Boolean functions; Input variables; Intelligent networks; Performance analysis; Testing; Complete test sets; L-expression; coverage; fault complexes; functional form; generic form; multiple fault events;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1979.1675221
  • Filename
    1675221