Charge storage in dielectrics

Author

Sessler, G.M.

Author_Institution

Inst. for Electroacoust., Tech. Univ., Darmstadt, West Germany

Volume

24

Issue

3

fYear

1989

fDate

6/1/1989 12:00:00 AM

Firstpage

395

Lastpage

402

Abstract

Work on charge storage processes in dielectrics performed over the past few years is reviewed. Results obtained on polymers with corona, electron-beam, and pressure-pulse methods and pertaining to trap filling, spatial distribution of the charge, radiation-induced conductivity, and dynamics of the charge decay are discussed. The generation of a variety of polarization distributions in polyvinylidene fluoride with electron-beam and other methods is reviewed. Some results on charge storage and transport in silicon dioxide are described

Keywords

EBIC; dielectric polarisation; dielectric properties of solids; electrets; polymers; space charge; surface potential; SiO₂; charge decay dynamics; charge storage processes; corona; dielectrics; electrets; electron beam method; polarization distributions; polymers; polyvinylidene fluoride; pressure-pulse methods; radiation-induced conductivity; space charge; spatial charge distribution; surface potential; trap filling; Charge measurement; Current measurement; Dielectrics; Electron beams; Polarization; Polymers; Silicon compounds; Surface charging; Surface contamination; Surface discharges;

fLanguage

English

Journal_Title

Electrical Insulation, IEEE Transactions on

Publisher

ieee

ISSN

0018-9367

Type

jour

DOI

10.1109/14.30879

Filename

30879