Comments on "The Error Latency of a Fault in a Sequential Digital Circuit"

In the paper "The Error Latency of a Fault in a Sequential Digital Circuit," the method presented in [1] to evaluate the random test length to be applied to a sequential circuit, is called the "approximation method." We agree with this name, but wish to offer the following interpretations and clarifications (using the notations of Shedletsky and McCluskey¹).