• DocumentCode
    1138655
  • Title

    Comments on "The Error Latency of a Fault in a Sequential Digital Circuit"

  • Author

    David, R. ; Tellez-Giron, R.

  • Author_Institution
    Laboratoire d´´Automatique, INP Grenoble
  • Issue
    1
  • fYear
    1979
  • Firstpage
    85
  • Lastpage
    86
  • Abstract
    In the paper "The Error Latency of a Fault in a Sequential Digital Circuit," the method presented in [1] to evaluate the random test length to be applied to a sequential circuit, is called the "approximation method." We agree with this name, but wish to offer the following interpretations and clarifications (using the notations of Shedletsky and McCluskey1).
  • Keywords
    Approximation methods; Circuit faults; Circuit testing; Cities and towns; Delay; Digital circuits; Equations; Fault detection; Indium phosphide; Sequential analysis;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1979.1675230
  • Filename
    1675230
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1138655