DocumentCode
1138676
Title
Camera calibration from surfaces of revolution
Author
Wong, Kwan-Yee K. ; Mendonca, Paulo R S ; Cipolla, Roberto
Author_Institution
Dept. of Comput. Sci. & Inf. Syst., Hong Kong Univ., China
Volume
25
Issue
2
fYear
2003
fDate
2/1/2003 12:00:00 AM
Firstpage
147
Lastpage
161
Abstract
This paper addresses the problem of calibrating a pinhole camera from images of a surface of revolution. Camera calibration is the process of determining the intrinsic or internal parameters (i.e., aspect ratio, focal length, and principal point) of a camera, and it is important for both motion estimation and metric reconstruction of 3D models. In this paper, a novel and simple calibration technique is introduced, which is based on exploiting the symmetry of images of surfaces of revolution. Traditional techniques for camera calibration involve taking images of some precisely machined calibration pattern (such as a calibration grid). The use of surfaces of revolution, which are commonly found in daily life (e.g., bowls and vases), makes the process easier as a result of the reduced cost and increased accessibility of the calibration objects. In this paper, it is shown that two images of a surface of revolution will provide enough information for determining the aspect ratio, focal length, and principal point of a camera with fixed intrinsic parameters. The algorithms presented in this paper have been implemented and tested with both synthetic and real data. Experimental results show that the camera calibration method presented is both practical and accurate.
Keywords
calibration; cameras; computer vision; image reconstruction; motion estimation; 3D models; aspect ratio; computer vision; experimental results; focal length; metric reconstruction; motion estimation; pinhole camera calibration; precisely machined calibration pattern; principal point; surfaces of revolution; symmetry; Calibration; Cameras; Computer vision; Costs; Feature extraction; Geometry; Image reconstruction; Motion estimation; Surface reconstruction; Testing;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2003.1177148
Filename
1177148
Link To Document