DocumentCode :
1138815
Title :
A Precise Cyclic CMOS Time-to-Digital Converter With Low Thermal Sensitivity
Author :
Chen, Chun-Chi ; Chen, Poki ; Hwang, Chorng-Sii ; Chang, Wei
Author_Institution :
Dept. of Electron. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
Volume :
52
Issue :
4
fYear :
2005
Firstpage :
834
Lastpage :
838
Abstract :
In this paper, a precise cyclic CMOS time-to-digital converter (TDC) with low thermal sensitivity is proposed. Through compensation, the thermal sensitivity of the new cyclic time-to-digital converter is reduced dramatically. The proposed TDC not only possesses reduced thermal sensitivity but also has a small chip size. The circuit was fabricated with TSMC 0.35 
m CMOS technology. The size of the circuit is only 0.40 mm by 0.30 mm. The experimental results show that a 
6% resolution variation of the new TDC was achieved over 0 
to 100 temperature range which is much better than the 25% resolution variation of the original uncompensated version. The effective resolution is as fine as 57.3ps/LSB at room temperature with a fluctuation of 3.5 ps over 0 to 100 temperature range, and the corresponding integral nonlinearities are all within 0.8 LSB. The minimum measurement rate is 33 kHz. The measured power consumption is about 3.5 uW.
m CMOS technology. The size of the circuit is only 0.40 mm by 0.30 mm. The experimental results show that a 6% resolution variation of the new TDC was achieved over 0 to 100 temperature range which is much better than the 25% resolution variation of the original uncompensated version. The effective resolution is as fine as 57.3ps/LSB at room temperature with a fluctuation of 3.5 ps over 0 to 100 temperature range, and the corresponding integral nonlinearities are all within 0.8 LSB. The minimum measurement rate is 33 kHz. The measured power consumption is about 3.5 uW.Keywords :
CMOS integrated circuits; analogue-digital conversion; power consumption; CMOS technology; circuit fabrication; fluctuation; integral nonlinearities; measured power consumption; room temperature; thermal compensation; thermal sensitivity; time-to-digital converter; CMOS technology; Circuits; Delay lines; Energy consumption; Fluctuations; Instruments; Power measurement; Semiconductor device measurement; Temperature distribution; Temperature sensors; Thermal compensation; thermal sensitivity; time-to-digital converter (TDC);
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2005.852708
Filename :
1495771
Link To Document :
