DocumentCode :
1138839
Title :
A 64-Channel Wide Dynamic Range Charge Measurement ASIC for Strip and Pixel Ionization Detectors
Author :
Mazza, G. ; Cirio, R. ; Donetti, M. ; Rosa, A. La ; Luparia, A. ; Marchetto, F. ; Peroni, C.
Author_Institution :
Ist. Nazionale di Fisica Nucl., Torino, Italy
Volume :
52
Issue :
4
fYear :
2005
Firstpage :
847
Lastpage :
853
Abstract :
In this paper we report a 64-channel application specified integrated circuit (ASIC) for the readout of parallel plate strip and pixel ionization detectors. The detectors measure the intensity and the geometrical characteristics of a hadron beam for hadrontherapy cancer treatments. The ASIC is based on a current to frequency converter followed by a counter. It uses a charge balancing integration technique to obtain a dynamic range in excess of 
with a nonlinearity of less than 1%. The ASIC has been designed in a CMOS 0.8 
technology and it has been used for the readout of both strip ionization detectors for beam calibration and pixel detectors for beam monitoring during treatment. A new version of the chip in CMOS 0.35 technology which allows bipolar input currents has been designed and is currently under test.
with a nonlinearity of less than 1%. The ASIC has been designed in a CMOS 0.8 technology and it has been used for the readout of both strip ionization detectors for beam calibration and pixel detectors for beam monitoring during treatment. A new version of the chip in CMOS 0.35 technology which allows bipolar input currents has been designed and is currently under test.Keywords :
analogue-digital conversion; application specific integrated circuits; cancer; charge measurement; dosimetry; ionisation chambers; position sensitive particle detectors; radiation therapy; ASIC; CMOS; analog-digital conversion; application specified integrated circuit; beam calibration; bipolar input currents; cancer treatments; charge balancing integration technique; charge measurement; dosimetry; hadron beam; hadrontherapy; parallel plate strip ionization detectors; pixel ionization detectors; radiation detector circuits; Application specific integrated circuits; CMOS technology; Cancer detection; Charge measurement; Detectors; Dynamic range; Frequency conversion; Integrated circuit measurements; Ionization; Strips; Analog–digital conversion; charge measurement; dosimetry; radiation detector circuits;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2005.852702
Filename :
1495773
Link To Document :
