Title :
Comments on "Multiple Fault Detection in Combinational Network"
Author_Institution :
Department of Computer Science and Engineering, Southern Methodist University
Abstract :
In the above paper,1the authors have defined complete test, closed fault set, fault set graph, and undetected fault set as follows.
Keywords :
Circuit faults; Digital systems; Electrical fault detection; Fault detection; Intelligent networks; Logic devices; Metastasis; Paper making; Synchronization; Testing;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1979.1675254
