• DocumentCode
    1139101
  • Title

    Simulation of circular silicon pressure sensors with a center boss for very low pressure measurement

  • Author

    Yasukawa, Akio ; Shimazoe, Michitaka ; Matsuoka, Yoshitaka

  • Author_Institution
    Hitachi Ltd., Tsuchiura, Japan
  • Volume
    36
  • Issue
    7
  • fYear
    1989
  • fDate
    7/1/1989 12:00:00 AM
  • Firstpage
    1295
  • Lastpage
    1302
  • Abstract
    A characteristics simulation method of circular silicon-diaphragm piezoresistive pressure sensors was developed to obtain accurate sensors for very-low-pressure measurement. The anisotropic stress-strain relationship of a silicon single-crystal plate and the nonlinear characteristics of silicon piezoresistive gauges were considered. Nonlinear deflection and strain formulas of circular silicon diaphragm sensors with a center boss and sensors with a center boss and ribs were derived by taking the effects of the large deflection and the support stiffness of the diaphragms into account. Based on these considerations, the characteristics of the sensors were simulated. The simulated results show good agreement with the observed results and indicate that output voltage can be greatly increased while maintaining low nonlinearity even in the low-pressure range by narrowing the rib width and thinning the diaphragm thickness of sensors with a center boss and ribs. This is because the rib strain that produces output voltage is increased while maintaining small deflection by using this type of sensor
  • Keywords
    electric sensing devices; elemental semiconductors; piezoelectric transducers; piezoresistance; pressure transducers; silicon; Si pressure sensors; center boss; circular silicon diaphragm sensors; nonlinearity; output voltage; piezoresistive pressure sensors; rib width; strain formulas; stress-strain relationship; very low pressure measurement; Anisotropic magnetoresistance; Capacitive sensors; Maintenance; Mechanical sensors; Piezoresistance; Pressure measurement; Ribs; Sensor phenomena and characterization; Silicon; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.30935
  • Filename
    30935