• DocumentCode
    113911
  • Title

    Active millimeter wave radar system for non-destructive, non-invasive underline fault detection and multilayer material analysis

  • Author

    Agarwal, Smriti ; Singh, Dharmendra ; Pathak, Nagendra P.

  • Author_Institution
    Center of Nanotechnol., Indian Inst. of Technol. Roorkee, Roorkee, India
  • fYear
    2014
  • fDate
    15-17 Dec. 2014
  • Firstpage
    369
  • Lastpage
    372
  • Abstract
    This paper presents a novel non-contact, nondestructive crack/ defect detection technique using an active millimeter wave radar system operating in V band for automatic structural health monitoring and quality check of consumer products at industry dispatch end. The increasing mishaps due to invisible cracks in building structures, roadways etc has lead to the demand of an accurate, non-destructive forecast system. The designed MMW radar enjoys good cross-range and down-range resolution of 4.27 mm and 8.8 mm, respectively. Further, experimental results show an accurate, non-contact multilayer dielectric thickness measurement as well as concealed crack detection ability of the proposed imaging methodology.
  • Keywords
    automatic optical inspection; condition monitoring; consumer products; crack detection; dielectric measurement; fault diagnosis; millimetre wave materials; millimetre wave measurement; millimetre wave radar; nondestructive testing; radar imaging; thickness measurement; MMW radar; V band; active millimeter wave radar system; automatic structural health monitoring; concealed crack detection; consumer product quality check; industry dispatch end; invisible cracks; multilayer material analysis; non-invasive underline fault detection; noncontact multilayer dielectric thickness measurement; nondestructive forecast system; nondestructive invasive underline fault detection; wavelength 4.27 mm; wavelength 8.8 mm; Imaging; Millimeter wave radar; Radar antennas; Radar detection; Radar imaging; Millimeter wave; active imaging radar; convolution; fault detection; multilayering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and RF Conference (IMaRC), 2014 IEEE International
  • Conference_Location
    Bangalore
  • Type

    conf

  • DOI
    10.1109/IMaRC.2014.7039035
  • Filename
    7039035