Title :
Exploring the feasibility of reputation systems under churn
Author :
Sánchez-Artigas, Marc ; García-López, Pedro ; Herrera, Blas
Author_Institution :
Dept. of Comput. Eng. & Math., Univ. Rovira i Virgili, Tarragona, Spain
fDate :
7/1/2009 12:00:00 AM
Abstract :
This letter examines how high rates of churn - the continuous process of node arrival and departure - affect rating mechanisms for peer-to-peer (P2P) networks. In particular, short peer lifetimes mean reputations are often generated from a small number of transactions, and thus are few reliable. To understand this relationship, this letter introduces an analytical model which determines the optimal transaction rate and the expected time to produce a reliable reputation, under both exponential and Pareto lifetime distributions.
Keywords :
Pareto distribution; exponential distribution; peer-to-peer computing; Pareto lifetime distribution; churn; exponential distribution; node arrival; node departure; peer-to-peer networks; reputation systems; Analytical models; Distributed computing; Ethics; Feedback; Hazards; Memory; Peer to peer computing; Protection; Stochastic systems; Traffic control; Reputation mechanisms, P2P networks, churn.;
Journal_Title :
Communications Letters, IEEE
DOI :
10.1109/LCOMM.2009.090573