• DocumentCode
    1139216
  • Title

    Silicon radiation detectors

  • Author

    Rehak, Pavel

  • Author_Institution
    Brookhaven Nat. Lab., Upton, NY, USA
  • Volume
    51
  • Issue
    5
  • fYear
    2004
  • Firstpage
    2492
  • Lastpage
    2497
  • Abstract
    The rapid progress of the past 20 years in silicon radiation detectors is reviewed. The availability of silicon as an almost ideal semiconductor material is one of the main reasons for this progress. The well-defined properties of the silicon-silicon dioxide interface allowed the development of detector structures beyond the structure of a classical diode detector, which was practically the only silicon detector structure 20 years ago. All new structures make use of an electric field parallel to the large surface of the detector. Improvements in the production of silicon detectors has lead to a substantial decrease of the detector leakage current. These detectors can achieve their best performance very close to or at room temperature.
  • Keywords
    X-ray detection; X-ray spectroscopy; leakage currents; reviews; silicon radiation detectors; 293 to 298 K; classical diode detector; detector leakage current; detector structure; detector surface; electric field; review; room temperature; semiconductor material; silicon X-ray spectroscopy; silicon drift detector; silicon radiation detector; silicon-silicon dioxide interface; solid-state radiation detector; Availability; Consumer electronics; Electronics industry; Gamma ray detection; Production; Radiation detectors; Silicon radiation detectors; Temperature; X-ray detection; X-ray detectors; Silicon drift detectors; silicon X-ray spectroscopy; solid-state radiation detectors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2004.836062
  • Filename
    1344359