DocumentCode :
1139375
Title :
Single Event Transient Propagation Through Digital Optocouplers
Author :
Adell, P.C. ; Mion, O. ; Schrimpf, R.D. ; Chatry, C. ; Calvel, P. ; Melotte, M.R.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
Volume :
52
Issue :
4
fYear :
2005
Firstpage :
1136
Lastpage :
1139
Abstract :
A new approach for assessing the risk of upsetting digital optocouplers due to the propagation of single event transients (SETs) is proposed. The optocoupler\´s input current 
and propagation time 
are found to be the most critical parameters for this approach. A case study using the 6N140 optocoupler and SETs measured at the output of the National Semiconductor LM139 is detailed to validate the concept.
and propagation time are found to be the most critical parameters for this approach. A case study using the 6N140 optocoupler and SETs measured at the output of the National Semiconductor LM139 is detailed to validate the concept.Keywords :
integrated optoelectronics; nuclear electronics; opto-isolators; radiation effects; 6N140 optocoupler; National Semiconductor LM139; analogue single event transient propagation; digital optocouplers; input current; propagation time; radiation hardness assurance; Analog integrated circuits; Application software; Application specific integrated circuits; Circuit testing; Integrated circuit measurements; Integrated circuit testing; Protection; Protons; Switches; Voltage control; Analog single event transients (SETs); SET propagation; optocouplers; radiation hardness assurance;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2005.851746
Filename :
1495818
Link To Document :
