DocumentCode :
1139426
Title :
Development of a Prototype Module for a DEPFET Pixel Vertex Detector for a Linear Collider
Author :
Kohrs, Robert ; Andricek, L. ; Fischer, P. ; Harter, M. ; Karagounis, M. ; Krüger, H. ; Lutz, G. ; Moser, H.G. ; Peric, I. ; Porro, M. ; Reuen, L. ; Richter, R.H. ; Sandow, C. ; Strüder, L. ; Trimpl, M. ; Wermes, N.
Author_Institution :
Phys. Inst., Univ. Bonn, Germany
Volume :
52
Issue :
4
fYear :
2005
Firstpage :
1171
Lastpage :
1175
Abstract :
For operation at a linear collider the excellent noise performance of depleted field effect transistor (DEPFET) pixels allows building very thin detectors with high spatial resolution and low power consumption. However, high readout speeds of 50 MHz line rate and 20 kHz for the full detector must be reached. A prototype system is presented, using a new DEPFET pixel matrix (128 \\times 64 pixels), fast steering chips (Switcher II) for row wise operation and a fast current based readout chip (CURO II). The sensors with small linear DEPFET pixels (22\\times36 \\mu\\hbox {m$^2$)} are optimized for fast readout and high spatial resolution. Measurements show that the complete removal of the accumulated signal charge from the internal gate (complete clear), which is fundamental for the foreseen readout mode, is feasible. The current based readout chip CUROII, containing current memory cells, pedestal subtraction and on chip zero suppression for a triggerless operation has been fabricated and tested. First results of a full prototype system are presented.
Keywords :
field effect transistors; linear colliders; nuclear electronics; position sensitive particle detectors; readout electronics; semiconductor counters; 128 pixels; 22 micron; 36 micron; 64 pixels; 8192 pixels; CURO II; DEPFET pixel vertex detector; International Linear Collider; Switcher II; active pixel sensor; chip zero suppression; current based readout chip; current memory cells; depleted field effect transistor; internal gate; noise performance; pedestal subtraction; prototype module; row wise operation; signal charge; steering chips; thin detectors; triggerless operation; Charge measurement; Current measurement; Detectors; Electrons; Energy consumption; FETs; Prototypes; Semiconductor device measurement; Spatial resolution; Testing; Active pixel sensor; CURO; DEPFET; International Linear Collider (ILC); vertex detector;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2005.852719
Filename :
1495824
Link To Document :
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