• DocumentCode
    1139426
  • Title

    Development of a Prototype Module for a DEPFET Pixel Vertex Detector for a Linear Collider

  • Author

    Kohrs, Robert ; Andricek, L. ; Fischer, P. ; Harter, M. ; Karagounis, M. ; Krüger, H. ; Lutz, G. ; Moser, H.G. ; Peric, I. ; Porro, M. ; Reuen, L. ; Richter, R.H. ; Sandow, C. ; Strüder, L. ; Trimpl, M. ; Wermes, N.

  • Author_Institution
    Phys. Inst., Univ. Bonn, Germany
  • Volume
    52
  • Issue
    4
  • fYear
    2005
  • Firstpage
    1171
  • Lastpage
    1175
  • Abstract
    For operation at a linear collider the excellent noise performance of depleted field effect transistor (DEPFET) pixels allows building very thin detectors with high spatial resolution and low power consumption. However, high readout speeds of 50 MHz line rate and 20 kHz for the full detector must be reached. A prototype system is presented, using a new DEPFET pixel matrix (128 \\times 64 pixels), fast steering chips (Switcher II) for row wise operation and a fast current based readout chip (CURO II). The sensors with small linear DEPFET pixels (22\\times36 \\mu\\hbox {m$^2$)} are optimized for fast readout and high spatial resolution. Measurements show that the complete removal of the accumulated signal charge from the internal gate (complete clear), which is fundamental for the foreseen readout mode, is feasible. The current based readout chip CUROII, containing current memory cells, pedestal subtraction and on chip zero suppression for a triggerless operation has been fabricated and tested. First results of a full prototype system are presented.
  • Keywords
    field effect transistors; linear colliders; nuclear electronics; position sensitive particle detectors; readout electronics; semiconductor counters; 128 pixels; 22 micron; 36 micron; 64 pixels; 8192 pixels; CURO II; DEPFET pixel vertex detector; International Linear Collider; Switcher II; active pixel sensor; chip zero suppression; current based readout chip; current memory cells; depleted field effect transistor; internal gate; noise performance; pedestal subtraction; prototype module; row wise operation; signal charge; steering chips; thin detectors; triggerless operation; Charge measurement; Current measurement; Detectors; Electrons; Energy consumption; FETs; Prototypes; Semiconductor device measurement; Spatial resolution; Testing; Active pixel sensor; CURO; DEPFET; International Linear Collider (ILC); vertex detector;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2005.852719
  • Filename
    1495824