• DocumentCode
    1139448
  • Title

    Outlier-resistant algorithms for detecting a change in a stochastic process

  • Author

    Bansal, Rakesh K. ; Papantoni-Kazakos, P.

  • Author_Institution
    Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
  • Volume
    35
  • Issue
    3
  • fYear
    1989
  • fDate
    5/1/1989 12:00:00 AM
  • Firstpage
    521
  • Lastpage
    535
  • Abstract
    Outlier-resistant algorithms that detect a change from a given nominal stationary process to another such process are given. The nominal processes are assumed to be mutually independent and to satisfy some general regularity conditions. The outlier sequences are assumed to be independently and identically distributed and independent of the nominal processes. The proposed algorithms are sequential and consist of uniformly bounded steps. The asymptotic performance of the algorithms is analyzed, both in the absence and the presence of outliers. Breakdown points and influence functions are defined and analyzed. The algorithms are studied in more detail for Gaussian autoregressive nominal processes
  • Keywords
    information theory; stochastic processes; Gaussian autoregressive nominal processes; asymptotic performance; breakdown points; independently and identically distributed; influence functions; nominal stationary process; outlier sequences; outlier-resistant algorithms; stochastic process; uniformly bounded steps; Algorithm design and analysis; Change detection algorithms; Electric breakdown; Fault detection; Image edge detection; Performance analysis; Pollution measurement; Random variables; Stochastic processes; Testing;
  • fLanguage
    English
  • Journal_Title
    Information Theory, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9448
  • Type

    jour

  • DOI
    10.1109/18.30974
  • Filename
    30974