• DocumentCode
    1139463
  • Title

    System and gram matrices of 3-D planogram data

  • Author

    Kazantsev, Ivan G. ; Matej, Samuel ; Lewitt, Robert M.

  • Author_Institution
    Dept. of Radiol., Univ. of Pennsylvania, Philadelphia, PA, USA
  • Volume
    51
  • Issue
    5
  • fYear
    2004
  • Firstpage
    2579
  • Lastpage
    2587
  • Abstract
    This paper addresses the topic of geometric voxel-based approaches to forward and inverse problems of image reconstruction from planogram data. We investigate 2- and 3-D (two-, three-dimensional) planar detector configurations for which we reduce complex geometrical calculations of Gram and system matrices to a series of simple transformations like shifts and parallel projections. We use a direct algebraic approach, or natural pixels approach in reconstruction. The approach needs precomputation and inversion of the Gram matrix with entries as volumes of intersection of two arbitrary natural pixels-strips or parallelepipeds. Numerical experiments with small-scale test data are presented.
  • Keywords
    geometry; image reconstruction; inverse problems; matrix algebra; positron emission tomography; single photon emission computed tomography; 2D planar detector configurations; 3D Planogram Data; 3D planar detector configurations; Gram matrices; PET; SPECT; arbitrary natural pixels; complex geometrical calculations; direct algebraic approach; forward problems; geometric voxel-based approaches; image reconstruction; inverse problems; natural pixels approach; numerical experiments; parallel projections; parallelepipeds; precomputation; shifts; small-scale test data; strips; structured matrices; system matrices; transformations; Detectors; Image reconstruction; Image representation; Integral equations; Inverse problems; Kernel; Pixel; Testing; Tomography; Transmission line matrix methods; -D reconstruction; natural pixels; planar detectors; structured matrices;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2004.834823
  • Filename
    1344380