• DocumentCode
    1139561
  • Title

    Analysis of the Signal Reliability Measure and an Evaluation Procedure

  • Author

    Koren, Israel

  • Author_Institution
    Department of Electrical Engineering, University of Southern California
  • Issue
    3
  • fYear
    1979
  • fDate
    3/1/1979 12:00:00 AM
  • Firstpage
    244
  • Lastpage
    249
  • Abstract
    The classical reliability measure of digital circuits, known as functional reliability, assumes that the circuit fails whenever a fault is present in it. It has long been known that this reliability measure is overly pessimistic since digital circuits may produce correct output signals even when some faults are present in them. A different reliability measure, known as signal reliability, is the probability that the circuit output is correct. This reliability measure is analyzed first and compared to the functional reliability measure. Next, a new procedure for the evaluation of the signal reliability measure is presented.
  • Keywords
    Combinational circuits; functional reliability; probability of fault occurrence; signal probability; signal reliability; Circuit faults; Costs; Digital circuits; Digital signal processing; Error correction; Indexing; Reflective binary codes; Signal analysis; Signal processing algorithms; Zinc; Combinational circuits; functional reliability; probability of fault occurrence; signal probability; signal reliability;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1979.1675326
  • Filename
    1675326