DocumentCode :
1139561
Title :
Analysis of the Signal Reliability Measure and an Evaluation Procedure
Author :
Koren, Israel
Author_Institution :
Department of Electrical Engineering, University of Southern California
Issue :
3
fYear :
1979
fDate :
3/1/1979 12:00:00 AM
Firstpage :
244
Lastpage :
249
Abstract :
The classical reliability measure of digital circuits, known as functional reliability, assumes that the circuit fails whenever a fault is present in it. It has long been known that this reliability measure is overly pessimistic since digital circuits may produce correct output signals even when some faults are present in them. A different reliability measure, known as signal reliability, is the probability that the circuit output is correct. This reliability measure is analyzed first and compared to the functional reliability measure. Next, a new procedure for the evaluation of the signal reliability measure is presented.
Keywords :
Combinational circuits; functional reliability; probability of fault occurrence; signal probability; signal reliability; Circuit faults; Costs; Digital circuits; Digital signal processing; Error correction; Indexing; Reflective binary codes; Signal analysis; Signal processing algorithms; Zinc; Combinational circuits; functional reliability; probability of fault occurrence; signal probability; signal reliability;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1979.1675326
Filename :
1675326
Link To Document :
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