Title :
Non destructive crack detection at X-band
Author :
Das, Pritam ; Belamgi, Sharanbasappa B. ; Ray, Sambaran
Author_Institution :
Sch. of Nucl. Studies & Applic., Jadavpur Univ., Kolkata, India
Abstract :
Non Destructive Testing (NDT) technique is one of the most challenging areas for researchers working in the field of microwave. In the present paper, use of open-ended T-Junction sensor was studied for detection of 3D cracks with rectangular aperture on a metal surface in X-Band. This technique shows better resolution with compared to other reported microwave NDT techniques.
Keywords :
crack detection; cracks; nondestructive testing; 3D crack detection; X-band; metal surface; microwave NDT techniques; nondestructive testing; open-ended T-Junction sensor; rectangular aperture; Image resolution; Surface cracks; Surface waves; Microwave imaging; Microwave nondestructive testing; metal crack detection;
Conference_Titel :
Electronics, Communication and Instrumentation (ICECI), 2014 International Conference on
Conference_Location :
Kolkata
Print_ISBN :
978-1-4799-3982-4
DOI :
10.1109/ICECI.2014.6767371
