DocumentCode
1139622
Title
Comments on "Redundancy Testing in Combinational Networks"
Author
Smith, James E.
Author_Institution
Department of Electrical and Computer Engineering, University of Wisconsin-Madison
Issue
3
fYear
1979
fDate
3/1/1979 12:00:00 AM
Firstpage
261
Lastpage
262
Abstract
In the above-mentioned paper1, Lee and Davidson present an algorithm for detecting all single redundant lines in a tree-type NAND network. In order to test for a single redundancy in a nontree network, they suggest replicating portions of the network (those which fan out) to get an equivalent tree-type NAND network. The algorithm for detecting single redundancies can then be applied to the equivalent tree-type network. However, a problem may arise if a single redundant connection in the original network, when replicated, leads to a set of connections all of which are irredundant when considered individually, but which are redundant when considered as a group. Lee and Davidson state that it is not known whether such a situation can occur. However, after some discussion they resolve the problem to the following question which they leave open: Can a set of 4 or more connections in a tree network corresponding to a single connection in the nontree network be redundant while any proper subset of the 4 or more lines is irredundant? The answer to this question will indicate whether the extension of their algorithm to nontree networks will always work.
Keywords
Circuit faults; Circuit testing; Decoding; Fault detection; Intelligent networks; Logic testing; Random access memory; Redundancy;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1979.1675332
Filename
1675332
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