• DocumentCode
    1139622
  • Title

    Comments on "Redundancy Testing in Combinational Networks"

  • Author

    Smith, James E.

  • Author_Institution
    Department of Electrical and Computer Engineering, University of Wisconsin-Madison
  • Issue
    3
  • fYear
    1979
  • fDate
    3/1/1979 12:00:00 AM
  • Firstpage
    261
  • Lastpage
    262
  • Abstract
    In the above-mentioned paper1, Lee and Davidson present an algorithm for detecting all single redundant lines in a tree-type NAND network. In order to test for a single redundancy in a nontree network, they suggest replicating portions of the network (those which fan out) to get an equivalent tree-type NAND network. The algorithm for detecting single redundancies can then be applied to the equivalent tree-type network. However, a problem may arise if a single redundant connection in the original network, when replicated, leads to a set of connections all of which are irredundant when considered individually, but which are redundant when considered as a group. Lee and Davidson state that it is not known whether such a situation can occur. However, after some discussion they resolve the problem to the following question which they leave open: Can a set of 4 or more connections in a tree network corresponding to a single connection in the nontree network be redundant while any proper subset of the 4 or more lines is irredundant? The answer to this question will indicate whether the extension of their algorithm to nontree networks will always work.
  • Keywords
    Circuit faults; Circuit testing; Decoding; Fault detection; Intelligent networks; Logic testing; Random access memory; Redundancy;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1979.1675332
  • Filename
    1675332